You are here: Home Products By Brands HIOKI-Japan Automatic Testing Equipment (ATE) Populated Board Testing

Populated Board Testing

  • Filter
  • Search
  Name SKU Description Category
fit-line-inspection-data-creation-system-ua1780
Hioki Fit-Line Inspection Data Creation System UA1780 Data Creation System Delivers 90% Faster Data Generation, 93% Lower Line Stoppage Times The UA1780 enables high-quality test programs in a short period of time by using net information that has been reverse-generated from Gerber data and component information libraries, and delivers maximum performance when used in conjunction with Hioki’s new FA1240-50 flying probe tester. Populated Board Testing
in-circuit-hitester-1220-50-51-52
Hioki In-Circuit HiTester 1220-50/-51/-52 High Performance Populated Board Testing with Expansion Capabilities In populated board production settings where improving productivity is key, even small time losses are unacceptable. The 1220 series provide a single solution for jobs that previously required multiple measuring instruments, featuring a compact PCI bus that delivers a dramatic speed boost of 150%. Populated Board Testing
x-y-in-circuit-hitester-1240-01-02-03
Hioki X-Y in-Circuit HiTester 1240-01/-02/-03 Detection of IC lead pseudo-contact (poor contact) states • High-speed testing at up to 0.025 sec./step (1240-01, 1240-03) • Detection of IC lead float and pseudo-contact states • Support for active testing (optional feature) • High-precision probing • Large testing area of 510 × 460 mm (1240-01, 1240-02) • Standard transport capability • Automatic alignment function and simple visual test function Populated Board Testing